New technique spots hidden defects to boost reliability of ultrathin electronics
Phys.org
February 26, 2026
Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters. Researchers at Rice University have shown that hard-to-spot defects in a widely used two-dimensional insulator can trap electrical charges and locally weaken the material, making it more likely to fail at lower voltages. The findings are published in Nano Letters.
Verticals
sciencephysics
Originally published on Phys.org on 2/26/2026